A SET‐tolerant StrongARM comparator with improved performance
Abstract In this paper, a radiation hardened by design StrongARM comparator is proposed to mitigate the radiation effects. With 12 additional transistors compared to the conventional one, the proposed structure shows much higher immunity to single‐event transients. During the amplification phase, wh...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
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Wiley
2024-12-01
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| Series: | Electronics Letters |
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| Online Access: | https://doi.org/10.1049/ell2.70094 |
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| _version_ | 1850108685332774912 |
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| author | Chentian Zhou Yuanyuan Han Xu Cheng Xiaoyang Zeng |
| author_facet | Chentian Zhou Yuanyuan Han Xu Cheng Xiaoyang Zeng |
| author_sort | Chentian Zhou |
| collection | DOAJ |
| description | Abstract In this paper, a radiation hardened by design StrongARM comparator is proposed to mitigate the radiation effects. With 12 additional transistors compared to the conventional one, the proposed structure shows much higher immunity to single‐event transients. During the amplification phase, when the input differential voltage is 10 mV, the proposed structure can withstand up to 18fC free charge, 45x far surpassing the conventional structure. During the regeneration phase, every sensitive node in the proposed structure can withstand a 200 fC‐injected charge. Compared to other redundant structures with performance deterioration, the proposed architecture exhibits high‐speed characteristics. When the differential voltage between two inputs is 1 mV, the delay of the new structure is 168.26 ps and the speed improvement is 118.02% over the conventional structure. |
| format | Article |
| id | doaj-art-faee7d84b90640c39899e1ae1fd7e1ae |
| institution | OA Journals |
| issn | 0013-5194 1350-911X |
| language | English |
| publishDate | 2024-12-01 |
| publisher | Wiley |
| record_format | Article |
| series | Electronics Letters |
| spelling | doaj-art-faee7d84b90640c39899e1ae1fd7e1ae2025-08-20T02:38:18ZengWileyElectronics Letters0013-51941350-911X2024-12-016023n/an/a10.1049/ell2.70094A SET‐tolerant StrongARM comparator with improved performanceChentian Zhou0Yuanyuan Han1Xu Cheng2Xiaoyang Zeng3The State Key Laboratory of Integrated Chips and Systems School of Microelectronics Fudan University Shanghai P. R. ChinaZhangjiang Laboratory Shanghai P. R. ChinaThe State Key Laboratory of Integrated Chips and Systems School of Microelectronics Fudan University Shanghai P. R. ChinaThe State Key Laboratory of Integrated Chips and Systems School of Microelectronics Fudan University Shanghai P. R. ChinaAbstract In this paper, a radiation hardened by design StrongARM comparator is proposed to mitigate the radiation effects. With 12 additional transistors compared to the conventional one, the proposed structure shows much higher immunity to single‐event transients. During the amplification phase, when the input differential voltage is 10 mV, the proposed structure can withstand up to 18fC free charge, 45x far surpassing the conventional structure. During the regeneration phase, every sensitive node in the proposed structure can withstand a 200 fC‐injected charge. Compared to other redundant structures with performance deterioration, the proposed architecture exhibits high‐speed characteristics. When the differential voltage between two inputs is 1 mV, the delay of the new structure is 168.26 ps and the speed improvement is 118.02% over the conventional structure.https://doi.org/10.1049/ell2.70094integrated circuit reliabilityradiation hardening (electronics) |
| spellingShingle | Chentian Zhou Yuanyuan Han Xu Cheng Xiaoyang Zeng A SET‐tolerant StrongARM comparator with improved performance Electronics Letters integrated circuit reliability radiation hardening (electronics) |
| title | A SET‐tolerant StrongARM comparator with improved performance |
| title_full | A SET‐tolerant StrongARM comparator with improved performance |
| title_fullStr | A SET‐tolerant StrongARM comparator with improved performance |
| title_full_unstemmed | A SET‐tolerant StrongARM comparator with improved performance |
| title_short | A SET‐tolerant StrongARM comparator with improved performance |
| title_sort | set tolerant strongarm comparator with improved performance |
| topic | integrated circuit reliability radiation hardening (electronics) |
| url | https://doi.org/10.1049/ell2.70094 |
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