Five-analyzer Johann spectrometer for hard X-ray photon-in/photon-out spectroscopy at the Inner Shell Spectroscopy beamline at NSLS-II: design, alignment and data acquisition

Here, a recently commissioned five-analyzer Johann spectrometer at the Inner Shell Spectroscopy beamline (8-ID) at the National Synchrotron Light Source II (NSLS-II) is presented. Designed for hard X-ray photon-in/photon-out spectroscopy, the spectrometer achieves a resolution in the 0.5–2 eV range,...

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Bibliographic Details
Main Authors: Akhil Tayal, David Scott Coburn, Donald Abel, Max Rakitin, Oksana Ivashkevych, Jakub Wlodek, Dominik Wierzbicki, Weihe Xu, Evgeny Nazaretski, Eli Stavitski, Denis Leshchev
Format: Article
Language:English
Published: International Union of Crystallography 2024-11-01
Series:Journal of Synchrotron Radiation
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Online Access:https://journals.iucr.org/paper?S1600577524009342
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Summary:Here, a recently commissioned five-analyzer Johann spectrometer at the Inner Shell Spectroscopy beamline (8-ID) at the National Synchrotron Light Source II (NSLS-II) is presented. Designed for hard X-ray photon-in/photon-out spectroscopy, the spectrometer achieves a resolution in the 0.5–2 eV range, depending on the element and/or emission line, providing detailed insights into the local electronic and geometric structure of materials. It serves a diverse user community, including fields such as physical, chemical, biological, environmental and materials sciences. This article details the mechanical design, alignment procedures and data-acquisition scheme of the spectrometer, with a particular focus on the continuous asynchronous data-acquisition approach that significantly enhances experimental efficiency.
ISSN:1600-5775