Measuring. Monitoring. Management. Control
Background. Currently, semiconductor structures and devices are used in many industries, in particular electronics, telecommunications, and instrumentation. This article discusses a method for experimentally determining their parameters by measuring the volt-ampere characteristics of semiconductor...
Saved in:
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Penza State University Publishing House
2024-12-01
|
| Series: | Измерение, мониторинг, управление, контроль |
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Summary: | Background. Currently, semiconductor structures and devices are used in many industries, in particular electronics,
telecommunications, and instrumentation. This article discusses a method for experimentally determining their
parameters by measuring the volt-ampere characteristics of semiconductors using an automated information and measurement
system. The purpose of the work is to study the electrophysical parameters of semiconductor components and
describe the measurement technique used as the basis of the measuring system. Materials and methods. The automated
information and measurement system is designed to study various semiconductor components and products, such asintegrated circuits, microcircuits, diodes, transistors, solar cells, zener diodes, charge-coupled devices, solar cells. All these
components are used in electronics, mechanical engineering, optoelectronics and signal processing systems. Results. The
volt-ampere characteristic was measured using the example of a semiconductor component (diode 2D212B), and the
results obtained were analyzed, presented in tabular and graphical form. Conclusions. The structure of an automated information
and measurement system is presented, which contains a measuring unit and a computer that controls measurements
and automated processing of measurement results in order to determine the electrophysical parameters of the
structures under study according to the measured volt-ampere characteristic. |
|---|---|
| ISSN: | 2307-5538 |