APA (7th ed.) Citation

Yang, Y., Zhang, W., Cheng, C., & Yeh, W. The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions. Wiley.

Chicago Style (17th ed.) Citation

Yang, Yi-Lin, Wenqi Zhang, Chi-Yun Cheng, and Wen-kuan Yeh. The Improvement of Reliability of High-k/Metal Gate PMOSFET Device with Various PMA Conditions. Wiley.

MLA (9th ed.) Citation

Yang, Yi-Lin, et al. The Improvement of Reliability of High-k/Metal Gate PMOSFET Device with Various PMA Conditions. Wiley.