Real-time Detection of Imperfect Wheat Grains on Wheat Pile Surface Based on IDS-YOLO
Currently, some intelligent devices are available to assist in the detection of imperfect wheat grains. However, the background of grain surface images acquired by intelligent devices is dense and complicated with overlapping particles, causing noise interferences in the detection of imperfect wheat...
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| Main Author: | |
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| Format: | Article |
| Language: | English |
| Published: |
China Food Publishing Company
2024-12-01
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| Series: | Shipin Kexue |
| Subjects: | |
| Online Access: | https://www.spkx.net.cn/fileup/1002-6630/PDF/2024-45-23-030.pdf |
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