Interface dipole evolution from the hybrid coupling between nitrogen-doped carbon quantum dots and polyethylenimine featuring the electron transport thin layer at Al/Si interfaces

The assessment of electron transport layer (ETL) for rear-contact engineering of silicon (Si) based optoelectronics has been considered as one of the critical challenges that leverage the performance improvement and device reliability. In this work, the hybrid design of ETL, obtained from the soluti...

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Bibliographic Details
Main Authors: Sasimontra Timjan, Ta-Cheng Wei, Kuan-Han Lin, Yi-Ting Li, Po-Hsuan Hsiao, Chia-Yun Chen
Format: Article
Language:English
Published: Elsevier 2025-01-01
Series:Applied Surface Science Advances
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Online Access:http://www.sciencedirect.com/science/article/pii/S2666523924000941
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