戴道锌, 徐静, 刘书哲, 何赛灵, & 何建军. 工艺误差对AWG串扰特性的影响. Editorial Department of Journal on Communications.
Chicago Style (17th ed.) Citation戴道锌, 徐静, 刘书哲, 何赛灵, and 何建军. 工艺误差对AWG串扰特性的影响. Editorial Department of Journal on Communications.
MLA (9th ed.) Citation戴道锌, et al. 工艺误差对AWG串扰特性的影响. Editorial Department of Journal on Communications.
Warning: These citations may not always be 100% accurate.