Statistical Analysis of Data From Electronic Component Lifetests (A Tutorial Paper)
Methods of statistically analysing data from electronic component lifetests are discussed. Particular emphasis is given to analysis techniques using the assumptions of constant hazard rate (Exponential distribution), the Weibull distribution and mixed Weibull distributions. The methods used for anal...
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| Main Author: | |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
1987-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1987/23687 |
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| Summary: | Methods of statistically analysing data from electronic component lifetests are discussed. Particular emphasis is given to
analysis techniques using the assumptions of constant hazard rate (Exponential distribution), the Weibull distribution
and mixed Weibull distributions. The methods used for analysing Weibull data when the data itself is non-uniform due
to both removal of test samples during test and also the non-continuance of surveillance of components under test are
discussed. Attention is finally given to the effect of two or more failure mechanisms which can produce S-shaped
patterns when data is plotted on Weibull Graph paper. |
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| ISSN: | 0882-7516 1563-5031 |