Analysis of Standards-Based Counterfeit Microelectronics Detection Methods
Counterfeiting of microelectronic parts is an ever-growing threat to the reliability and security of electronic systems. A study was conducted to investigate techniques for the detection of counterfeit microelectronic parts. Authentic, remarked, and cloned parts were included in the study. The data...
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| Format: | Article |
| Language: | English |
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IEEE
2025-01-01
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| Series: | IEEE Access |
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| Online Access: | https://ieeexplore.ieee.org/document/10829603/ |
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| author | Devon R. Richman Michael H. Azarian Diganta Das Michael Pecht |
| author_facet | Devon R. Richman Michael H. Azarian Diganta Das Michael Pecht |
| author_sort | Devon R. Richman |
| collection | DOAJ |
| description | Counterfeiting of microelectronic parts is an ever-growing threat to the reliability and security of electronic systems. A study was conducted to investigate techniques for the detection of counterfeit microelectronic parts. Authentic, remarked, and cloned parts were included in the study. The data presented in this paper is the first collection of quantitative data on counterfeit testing, including the performance of individual test methods. Testing was performed by a test laboratory based on SAE AS6171 methods, and the reported results included qualitative observations and observed counterfeit defects. The study demonstrated that standards-based methods effectively detect remarked and cloned microelectronic parts. Cloned parts are of particular concern as more sophisticated versions contain fewer defects and are at risk of not being detected. Two of the cloned part numbers included in the study were found to have few counterfeit defects, all of which could be corrected by a counterfeiter to avoid detection. Insights into the performance of individual test methods based on the type of counterfeit are presented. These results contribute to the ongoing efforts to mitigate the risks from counterfeit microelectronics by continually improving testing standards and practices, such as the possible need to perform additional testing to ensure cloned parts are detected. |
| format | Article |
| id | doaj-art-f5a0958fe13743378b769610e101bcb4 |
| institution | Kabale University |
| issn | 2169-3536 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj-art-f5a0958fe13743378b769610e101bcb42025-01-15T00:03:27ZengIEEEIEEE Access2169-35362025-01-01137691770410.1109/ACCESS.2025.352651810829603Analysis of Standards-Based Counterfeit Microelectronics Detection MethodsDevon R. Richman0https://orcid.org/0000-0002-7872-0257Michael H. Azarian1https://orcid.org/0000-0002-1434-6972Diganta Das2https://orcid.org/0000-0001-9097-2118Michael Pecht3https://orcid.org/0000-0003-1126-8662Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, USACenter for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, USACenter for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, USACenter for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, USACounterfeiting of microelectronic parts is an ever-growing threat to the reliability and security of electronic systems. A study was conducted to investigate techniques for the detection of counterfeit microelectronic parts. Authentic, remarked, and cloned parts were included in the study. The data presented in this paper is the first collection of quantitative data on counterfeit testing, including the performance of individual test methods. Testing was performed by a test laboratory based on SAE AS6171 methods, and the reported results included qualitative observations and observed counterfeit defects. The study demonstrated that standards-based methods effectively detect remarked and cloned microelectronic parts. Cloned parts are of particular concern as more sophisticated versions contain fewer defects and are at risk of not being detected. Two of the cloned part numbers included in the study were found to have few counterfeit defects, all of which could be corrected by a counterfeiter to avoid detection. Insights into the performance of individual test methods based on the type of counterfeit are presented. These results contribute to the ongoing efforts to mitigate the risks from counterfeit microelectronics by continually improving testing standards and practices, such as the possible need to perform additional testing to ensure cloned parts are detected.https://ieeexplore.ieee.org/document/10829603/Counterfeit detectionmicroelectronicsSAE AS6171standards-based testingsupply chain security |
| spellingShingle | Devon R. Richman Michael H. Azarian Diganta Das Michael Pecht Analysis of Standards-Based Counterfeit Microelectronics Detection Methods IEEE Access Counterfeit detection microelectronics SAE AS6171 standards-based testing supply chain security |
| title | Analysis of Standards-Based Counterfeit Microelectronics Detection Methods |
| title_full | Analysis of Standards-Based Counterfeit Microelectronics Detection Methods |
| title_fullStr | Analysis of Standards-Based Counterfeit Microelectronics Detection Methods |
| title_full_unstemmed | Analysis of Standards-Based Counterfeit Microelectronics Detection Methods |
| title_short | Analysis of Standards-Based Counterfeit Microelectronics Detection Methods |
| title_sort | analysis of standards based counterfeit microelectronics detection methods |
| topic | Counterfeit detection microelectronics SAE AS6171 standards-based testing supply chain security |
| url | https://ieeexplore.ieee.org/document/10829603/ |
| work_keys_str_mv | AT devonrrichman analysisofstandardsbasedcounterfeitmicroelectronicsdetectionmethods AT michaelhazarian analysisofstandardsbasedcounterfeitmicroelectronicsdetectionmethods AT digantadas analysisofstandardsbasedcounterfeitmicroelectronicsdetectionmethods AT michaelpecht analysisofstandardsbasedcounterfeitmicroelectronicsdetectionmethods |