Richman, D. R., Azarian, M. H., Das, D., & Pecht, M. Analysis of Standards-Based Counterfeit Microelectronics Detection Methods. IEEE.
Chicago Style (17th ed.) CitationRichman, Devon R., Michael H. Azarian, Diganta Das, and Michael Pecht. Analysis of Standards-Based Counterfeit Microelectronics Detection Methods. IEEE.
MLA (9th ed.) CitationRichman, Devon R., et al. Analysis of Standards-Based Counterfeit Microelectronics Detection Methods. IEEE.
Warning: These citations may not always be 100% accurate.