Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films

Summary: We describe an improved Bayesian inference methodology to characterize photovoltaic materials by matching charge carrier simulations to spectroscopy data. A “parallel tempering” scheme is introduced, which efficiently and reliably locates the global maximum in the complex multimodal distrib...

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Main Authors: Calvin Fai, Anthony J.C. Ladd, Charles J. Hages, Gregory A. Manoukian, Jason B. Baxter
Format: Article
Language:English
Published: Elsevier 2025-02-01
Series:iScience
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Online Access:http://www.sciencedirect.com/science/article/pii/S2589004225001105
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_version_ 1825206915827761152
author Calvin Fai
Anthony J.C. Ladd
Charles J. Hages
Gregory A. Manoukian
Jason B. Baxter
author_facet Calvin Fai
Anthony J.C. Ladd
Charles J. Hages
Gregory A. Manoukian
Jason B. Baxter
author_sort Calvin Fai
collection DOAJ
description Summary: We describe an improved Bayesian inference methodology to characterize photovoltaic materials by matching charge carrier simulations to spectroscopy data. A “parallel tempering” scheme is introduced, which efficiently and reliably locates the global maximum in the complex multimodal distributions that are characteristic of cadmium telluride (CdTe) films. Our results show that the standard carrier transport model cannot explain the observed decay of time-resolved photoluminescence (TRPL) data from CdTe films and that there is carrier trapping within low-lying defect states. This inference has been confirmed by temperature-dependent TRPL and time-resolved emission spectroscopy (TRES). Our work shows that Bayesian inference can discriminate between plausible physics models, as well as determine parameter values for a given model. Finally, we have combined TRPL with time-resolved terahertz spectroscopy (TRTS) to describe the dynamics on nanosecond to microsecond time scales. These results show that sample degradation can be detected by its effect on surface recombination.
format Article
id doaj-art-f50203fca0d24fa497c4c02ce7ac9172
institution Kabale University
issn 2589-0042
language English
publishDate 2025-02-01
publisher Elsevier
record_format Article
series iScience
spelling doaj-art-f50203fca0d24fa497c4c02ce7ac91722025-02-07T04:48:03ZengElsevieriScience2589-00422025-02-01282111850Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin filmsCalvin Fai0Anthony J.C. Ladd1Charles J. Hages2Gregory A. Manoukian3Jason B. Baxter4Department of Chemical Engineering, University of Florida, Gainesville, FL 32611, USADepartment of Chemical Engineering, University of Florida, Gainesville, FL 32611, USA; Corresponding authorDepartment of Chemical Engineering, University of Florida, Gainesville, FL 32611, USADepartment of Chemical and Biological Engineering, Drexel University, Philadelphia, PA 19104, USADepartment of Chemical and Biological Engineering, Drexel University, Philadelphia, PA 19104, USASummary: We describe an improved Bayesian inference methodology to characterize photovoltaic materials by matching charge carrier simulations to spectroscopy data. A “parallel tempering” scheme is introduced, which efficiently and reliably locates the global maximum in the complex multimodal distributions that are characteristic of cadmium telluride (CdTe) films. Our results show that the standard carrier transport model cannot explain the observed decay of time-resolved photoluminescence (TRPL) data from CdTe films and that there is carrier trapping within low-lying defect states. This inference has been confirmed by temperature-dependent TRPL and time-resolved emission spectroscopy (TRES). Our work shows that Bayesian inference can discriminate between plausible physics models, as well as determine parameter values for a given model. Finally, we have combined TRPL with time-resolved terahertz spectroscopy (TRTS) to describe the dynamics on nanosecond to microsecond time scales. These results show that sample degradation can be detected by its effect on surface recombination.http://www.sciencedirect.com/science/article/pii/S2589004225001105PhysicsEngineeringEnergy materials
spellingShingle Calvin Fai
Anthony J.C. Ladd
Charles J. Hages
Gregory A. Manoukian
Jason B. Baxter
Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films
iScience
Physics
Engineering
Energy materials
title Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films
title_full Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films
title_fullStr Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films
title_full_unstemmed Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films
title_short Parallel tempered Bayesian inference for characterizing non-ideal semiconductors: Carrier trapping in cadmium telluride thin films
title_sort parallel tempered bayesian inference for characterizing non ideal semiconductors carrier trapping in cadmium telluride thin films
topic Physics
Engineering
Energy materials
url http://www.sciencedirect.com/science/article/pii/S2589004225001105
work_keys_str_mv AT calvinfai paralleltemperedbayesianinferenceforcharacterizingnonidealsemiconductorscarriertrappingincadmiumtelluridethinfilms
AT anthonyjcladd paralleltemperedbayesianinferenceforcharacterizingnonidealsemiconductorscarriertrappingincadmiumtelluridethinfilms
AT charlesjhages paralleltemperedbayesianinferenceforcharacterizingnonidealsemiconductorscarriertrappingincadmiumtelluridethinfilms
AT gregoryamanoukian paralleltemperedbayesianinferenceforcharacterizingnonidealsemiconductorscarriertrappingincadmiumtelluridethinfilms
AT jasonbbaxter paralleltemperedbayesianinferenceforcharacterizingnonidealsemiconductorscarriertrappingincadmiumtelluridethinfilms