Dark-field X-ray microscopy with structured illumination for three-dimensional imaging
Abstract Dark-field X-ray microscopy is a lens-based technique that enables real-space imaging of heterogeneous micro- and meso-scale ordered materials. However, achieving accurate three-dimensional (3D) reconstruction often requires meticulous sample alignment or rastering, requiring complex rotati...
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| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Language: | English |
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Nature Portfolio
2025-01-01
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| Series: | Communications Physics |
| Online Access: | https://doi.org/10.1038/s42005-025-01952-2 |
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| _version_ | 1832585678042431488 |
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| author | Doğa Gürsoy Kaan Alp Yay Elliot Kisiel Michael Wojcik Dina Sheyfer Arndt Last Matthew Highland Ian Randal Fisher Stephan Hruszkewycz Zahir Islam |
| author_facet | Doğa Gürsoy Kaan Alp Yay Elliot Kisiel Michael Wojcik Dina Sheyfer Arndt Last Matthew Highland Ian Randal Fisher Stephan Hruszkewycz Zahir Islam |
| author_sort | Doğa Gürsoy |
| collection | DOAJ |
| description | Abstract Dark-field X-ray microscopy is a lens-based technique that enables real-space imaging of heterogeneous micro- and meso-scale ordered materials. However, achieving accurate three-dimensional (3D) reconstruction often requires meticulous sample alignment or rastering, requiring complex rotational setups and extended acquisition times. To address these challenges, we introduce a structured illumination technique optimized for 3D imaging of ordered materials at sub-micrometer length scales. Our approach employs a coded aperture to spatially modulate the incident X-ray beam, enabling 3D structural reconstruction from images captured at various aperture positions. Unlike current 3D imaging approaches, which often rely on rotational or rastering methods, our technique uses scanning X-ray silhouettes of the coded aperture for depth resolution along the diffraction axis. This eliminates the need for sample rotation or rastering, resulting in a highly stable and efficient imaging modality. We validated the efficacy of this approach through experimental imaging of an isolated twin domain within a bulk single crystal of an iron pnictide using a dark-field X-ray microscope. This advancement aligns with the enhanced brightness upgrades of modern synchrotron radiation facilities, unlocking new possibilities for high-resolution imaging of ordered materials. |
| format | Article |
| id | doaj-art-f3cbc6c05b9549dbb35048c75c5e249c |
| institution | Kabale University |
| issn | 2399-3650 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Communications Physics |
| spelling | doaj-art-f3cbc6c05b9549dbb35048c75c5e249c2025-01-26T12:37:04ZengNature PortfolioCommunications Physics2399-36502025-01-01811710.1038/s42005-025-01952-2Dark-field X-ray microscopy with structured illumination for three-dimensional imagingDoğa Gürsoy0Kaan Alp Yay1Elliot Kisiel2Michael Wojcik3Dina Sheyfer4Arndt Last5Matthew Highland6Ian Randal Fisher7Stephan Hruszkewycz8Zahir Islam9Advanced Photon Source, Argonne National LaboratoryDepartment of Physics, Stanford UniversityAdvanced Photon Source, Argonne National LaboratoryAdvanced Photon Source, Argonne National LaboratoryAdvanced Photon Source, Argonne National LaboratoryInstitute of Microstructure Technology, Karlsruhe Institute of TechnologyAdvanced Photon Source, Argonne National LaboratoryGeballe Laboratory for Advanced Materials, Stanford UniversityMaterials Science and Engineering Division, Argonne National LaboratoryAdvanced Photon Source, Argonne National LaboratoryAbstract Dark-field X-ray microscopy is a lens-based technique that enables real-space imaging of heterogeneous micro- and meso-scale ordered materials. However, achieving accurate three-dimensional (3D) reconstruction often requires meticulous sample alignment or rastering, requiring complex rotational setups and extended acquisition times. To address these challenges, we introduce a structured illumination technique optimized for 3D imaging of ordered materials at sub-micrometer length scales. Our approach employs a coded aperture to spatially modulate the incident X-ray beam, enabling 3D structural reconstruction from images captured at various aperture positions. Unlike current 3D imaging approaches, which often rely on rotational or rastering methods, our technique uses scanning X-ray silhouettes of the coded aperture for depth resolution along the diffraction axis. This eliminates the need for sample rotation or rastering, resulting in a highly stable and efficient imaging modality. We validated the efficacy of this approach through experimental imaging of an isolated twin domain within a bulk single crystal of an iron pnictide using a dark-field X-ray microscope. This advancement aligns with the enhanced brightness upgrades of modern synchrotron radiation facilities, unlocking new possibilities for high-resolution imaging of ordered materials.https://doi.org/10.1038/s42005-025-01952-2 |
| spellingShingle | Doğa Gürsoy Kaan Alp Yay Elliot Kisiel Michael Wojcik Dina Sheyfer Arndt Last Matthew Highland Ian Randal Fisher Stephan Hruszkewycz Zahir Islam Dark-field X-ray microscopy with structured illumination for three-dimensional imaging Communications Physics |
| title | Dark-field X-ray microscopy with structured illumination for three-dimensional imaging |
| title_full | Dark-field X-ray microscopy with structured illumination for three-dimensional imaging |
| title_fullStr | Dark-field X-ray microscopy with structured illumination for three-dimensional imaging |
| title_full_unstemmed | Dark-field X-ray microscopy with structured illumination for three-dimensional imaging |
| title_short | Dark-field X-ray microscopy with structured illumination for three-dimensional imaging |
| title_sort | dark field x ray microscopy with structured illumination for three dimensional imaging |
| url | https://doi.org/10.1038/s42005-025-01952-2 |
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