Rapid, comprehensive search of crystalline phases from X-ray diffraction in seconds via GPU-accelerated Bayesian variational inference
In analysis of X-ray diffraction data, identifying the crystalline phase is important for interpreting the material. The typical method is identifying the crystalline phase from the coincidence of the main diffraction peaks. This method identifies crystalline phases by matching them as individual cr...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor & Francis Group
2025-12-01
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| Series: | Science and Technology of Advanced Materials: Methods |
| Subjects: | |
| Online Access: | https://www.tandfonline.com/doi/10.1080/27660400.2025.2485016 |
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