A Defect Detection Algorithm for Optoelectronic Detectors Utilizing GLV-YOLO

A Defect Detection Algorithm for Optoelectronic Detectors Utilizing GLV-YOLO

Photodetectors are indispensable in a multitude of applications, with the detection of surface defects serving as a cornerstone for their production and advancement. To meet the demands of real-time and accurate defect detection, this paper introduces an optimization algorithm based on the GLV-YOLO...

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Bibliographic Details
Main Authors: Xinfang Zhao, Qinghua Lyu, Hui Zeng, Zhuoyi Ling, Zhongsheng Zhai, Hui Lyu, Saffa Riffat, Benyuan Chen, Wanting Wang
Format: Article
Language:English
Published: MDPI AG 2025-02-01
Series:Micromachines
Subjects:
lightweight model
machine vision
PIN photodiode
surface defect detection
Online Access:https://www.mdpi.com/2072-666X/16/3/267
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