On-Chip Age Estimation Using Machine Learning
The semiconductor supply chain industry is spread worldwide to reduce costs and meet the high demand for integrated circuits (ICs) in electronic systems. The high utilisation of electronic devices in the next decade is forecasted to reach trillions, increasing the already high volume of e-waste. It...
Saved in:
| Main Authors: | Turki Alnuayri, Saqib Khursheed, Daniele Rossi |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10980245/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Aging Analysis and Degradation Prediction of PLL Circuits in 14-nm FinFET Technology
by: Meng Li, et al.
Published: (2025-01-01) -
A Small Tamper-Resistant Anti-Recycling IC Sensor With a Reused I/O Interface and DC Signalling
by: Alexandros Dimopoulos, et al.
Published: (2024-01-01) -
Reliability Issues and Degradation Mechanisms of p-GaN Gated E-Mode AlGaN/GaN Power HEMTs: A Critical Review
by: J. Ajayan, et al.
Published: (2025-01-01) -
METHODOLOGY FOR VERIFYING THE CHIP AUTHENTICITY BASED ON DYNAMIC ENERGY CONSUMPTION ANALYSIS
by: Vladislav A. Rogachev, et al.
Published: (2025-05-01) -
Low-Temperature Deuterium Annealing for HfO₂/SiO₂ Gate Dielectric in Silicon MOSFETs
by: Tae-Hyun Kil, et al.
Published: (2024-01-01)