On the Nature of Dielectric Breakdown in Ultra-thin Langmuir Films

On the Nature of Dielectric Breakdown in Ultra-thin Langmuir Films

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Bibliographic Details
Main Author:	V. K. Srivastava
Format:	Article
Language:	English
Published:	Wiley 1976-01-01
Series:	Active and Passive Electronic Components
Online Access:	http://dx.doi.org/10.1155/APEC.3.117
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