A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packaging

Copper pillar bumps are widely utilized in advanced packaging technologies, representing a crucial foundation for 3D packaging. However, the mechanical properties of Sn3Ag bumps on copper columns often fall short of meeting increasingly demanding service conditions. Additionally, the loss of effecti...

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Main Authors: JinTao Wang, YiNi Chen, ZiWen Lv, XiaoYu Han, ZiHan Pan, Feng Tian, MingYuan Zhao, HongBo Xu, GaoLiang Peng, HongTao Chen, MingYu Li
Format: Article
Language:English
Published: Elsevier 2024-11-01
Series:Journal of Materials Research and Technology
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Online Access:http://www.sciencedirect.com/science/article/pii/S2238785424025912
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author JinTao Wang
YiNi Chen
ZiWen Lv
XiaoYu Han
ZiHan Pan
Feng Tian
MingYuan Zhao
HongBo Xu
GaoLiang Peng
HongTao Chen
MingYu Li
author_facet JinTao Wang
YiNi Chen
ZiWen Lv
XiaoYu Han
ZiHan Pan
Feng Tian
MingYuan Zhao
HongBo Xu
GaoLiang Peng
HongTao Chen
MingYu Li
author_sort JinTao Wang
collection DOAJ
description Copper pillar bumps are widely utilized in advanced packaging technologies, representing a crucial foundation for 3D packaging. However, the mechanical properties of Sn3Ag bumps on copper columns often fall short of meeting increasingly demanding service conditions. Additionally, the loss of effectiveness due to excessive growth of intermetallic compounds at the interface needs to be addressed. To enhance the Sn₃Ag bumps and inhibit the excessive growth of intermetallic compounds, CoSn₃ nanocrystals were prepared, and Sn₃Ag–CoSn₃ composite copper pillar bumps were fabricated through composite electroplating. Upon reflowing, the CoSn3 nanocrystals decomposed, resulting in a significant formation of (Cu,Co)6Sn5 nanoparticles within the Sn3Ag matrix. The (Cu,Co)6Sn5 nanoparticles not only strengthen the solder joints by pinning, but also significantly reduced the excessive growth of interfacial intermetallic compounds, ultimately improving the service performance and reliability of the solder joints.
format Article
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institution OA Journals
issn 2238-7854
language English
publishDate 2024-11-01
publisher Elsevier
record_format Article
series Journal of Materials Research and Technology
spelling doaj-art-eebf943c72cc410a8a180c46256ebbfe2025-08-20T01:57:24ZengElsevierJournal of Materials Research and Technology2238-78542024-11-01337157716810.1016/j.jmrt.2024.11.063A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packagingJinTao Wang0YiNi Chen1ZiWen Lv2XiaoYu Han3ZiHan Pan4Feng Tian5MingYuan Zhao6HongBo Xu7GaoLiang Peng8HongTao Chen9MingYu Li10QianYuan National Laboratory, HangZhou, 310000, China; Corresponding author.Sauvage Laboratory for Smart Materials, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, ChinaState Key Laboratory of Robotics and System, Harbin Institute of Technology, Harbin, 150001, ChinaChongqing Materials Research Institute Co.Ltd, Chongqing, 400001, ChinaState Key Laboratory of Robotics and System, Harbin Institute of Technology, Harbin, 150001, ChinaSauvage Laboratory for Smart Materials, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, ChinaQianYuan National Laboratory, HangZhou, 310000, ChinaQianYuan National Laboratory, HangZhou, 310000, ChinaState Key Laboratory of Robotics and System, Harbin Institute of Technology, Harbin, 150001, China; Corresponding author.Sauvage Laboratory for Smart Materials, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, China; Corresponding author.Sauvage Laboratory for Smart Materials, Harbin Institute of Technology (Shenzhen), Shenzhen, 518055, ChinaCopper pillar bumps are widely utilized in advanced packaging technologies, representing a crucial foundation for 3D packaging. However, the mechanical properties of Sn3Ag bumps on copper columns often fall short of meeting increasingly demanding service conditions. Additionally, the loss of effectiveness due to excessive growth of intermetallic compounds at the interface needs to be addressed. To enhance the Sn₃Ag bumps and inhibit the excessive growth of intermetallic compounds, CoSn₃ nanocrystals were prepared, and Sn₃Ag–CoSn₃ composite copper pillar bumps were fabricated through composite electroplating. Upon reflowing, the CoSn3 nanocrystals decomposed, resulting in a significant formation of (Cu,Co)6Sn5 nanoparticles within the Sn3Ag matrix. The (Cu,Co)6Sn5 nanoparticles not only strengthen the solder joints by pinning, but also significantly reduced the excessive growth of interfacial intermetallic compounds, ultimately improving the service performance and reliability of the solder joints.http://www.sciencedirect.com/science/article/pii/S22387854240259123D packagingCopper pillarNanoparticlesCoatingElectroplated
spellingShingle JinTao Wang
YiNi Chen
ZiWen Lv
XiaoYu Han
ZiHan Pan
Feng Tian
MingYuan Zhao
HongBo Xu
GaoLiang Peng
HongTao Chen
MingYu Li
A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packaging
Journal of Materials Research and Technology
3D packaging
Copper pillar
Nanoparticles
Coating
Electroplated
title A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packaging
title_full A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packaging
title_fullStr A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packaging
title_full_unstemmed A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packaging
title_short A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packaging
title_sort sn3ag cosn3 composite copper pillar bump for three dimensional packaging
topic 3D packaging
Copper pillar
Nanoparticles
Coating
Electroplated
url http://www.sciencedirect.com/science/article/pii/S2238785424025912
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