Modeling temperature distribution in the driving elements INTEGRATED CIRCUITS RESULTING electrostatic discharge

Modeling temperature distribution in the driving elements INTEGRATED CIRCUITS RESULTING electrostatic discharge

Investigated experimentally the principle of propagation of thermal fields in integrated circuits as a result of electrostatic discharge. A numerical model of the temperature distribution in the current-carrying elements of integrated circuits due to contact effects of static electricity, and electr...

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Bibliographic Details
Main Authors: G. A. Piskun, V. F. Alexeev, V. L. Lanin, V. G. Levin
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
неразрушающий контроль
электростатический разряд
численная модель
Online Access:https://doklady.bsuir.by/jour/article/view/319
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