Modeling temperature distribution in the driving elements INTEGRATED CIRCUITS RESULTING electrostatic discharge

Investigated experimentally the principle of propagation of thermal fields in integrated circuits as a result of electrostatic discharge. A numerical model of the temperature distribution in the current-carrying elements of integrated circuits due to contact effects of static electricity, and electr...

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Main Authors: G. A. Piskun, V. F. Alexeev, V. L. Lanin, V. G. Levin
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2019-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
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Online Access:https://doklady.bsuir.by/jour/article/view/319
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author G. A. Piskun
V. F. Alexeev
V. L. Lanin
V. G. Levin
author_facet G. A. Piskun
V. F. Alexeev
V. L. Lanin
V. G. Levin
author_sort G. A. Piskun
collection DOAJ
description Investigated experimentally the principle of propagation of thermal fields in integrated circuits as a result of electrostatic discharge. A numerical model of the temperature distribution in the current-carrying elements of integrated circuits due to contact effects of static electricity, and electrical conductivity based on the Fourier analysis of the thermal conductivity is proposed. The developed model predicts the temperature dependence of the discharge voltage and identify the most vulnerable conductive region by identifying local areas of melting.
format Article
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institution DOAJ
issn 1729-7648
language Russian
publishDate 2019-06-01
publisher Educational institution «Belarusian State University of Informatics and Radioelectronics»
record_format Article
series Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
spelling doaj-art-ed4faad762204c84a2951d8f4ca89d772025-08-20T03:02:15ZrusEducational institution «Belarusian State University of Informatics and Radioelectronics»Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki1729-76482019-06-01041622318Modeling temperature distribution in the driving elements INTEGRATED CIRCUITS RESULTING electrostatic dischargeG. A. Piskun0V. F. Alexeev1V. L. Lanin2V. G. Levin3Белорусский государственный университет информатики и радиоэлектроникиБелорусский государственный университет информатики и радиоэлектроникиБелорусский государственный университет информатики и радиоэлектроникиБелорусский государственный университет информатики и радиоэлектроникиInvestigated experimentally the principle of propagation of thermal fields in integrated circuits as a result of electrostatic discharge. A numerical model of the temperature distribution in the current-carrying elements of integrated circuits due to contact effects of static electricity, and electrical conductivity based on the Fourier analysis of the thermal conductivity is proposed. The developed model predicts the temperature dependence of the discharge voltage and identify the most vulnerable conductive region by identifying local areas of melting.https://doklady.bsuir.by/jour/article/view/319неразрушающий контрольэлектростатический разрядчисленная модель
spellingShingle G. A. Piskun
V. F. Alexeev
V. L. Lanin
V. G. Levin
Modeling temperature distribution in the driving elements INTEGRATED CIRCUITS RESULTING electrostatic discharge
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
неразрушающий контроль
электростатический разряд
численная модель
title Modeling temperature distribution in the driving elements INTEGRATED CIRCUITS RESULTING electrostatic discharge
title_full Modeling temperature distribution in the driving elements INTEGRATED CIRCUITS RESULTING electrostatic discharge
title_fullStr Modeling temperature distribution in the driving elements INTEGRATED CIRCUITS RESULTING electrostatic discharge
title_full_unstemmed Modeling temperature distribution in the driving elements INTEGRATED CIRCUITS RESULTING electrostatic discharge
title_short Modeling temperature distribution in the driving elements INTEGRATED CIRCUITS RESULTING electrostatic discharge
title_sort modeling temperature distribution in the driving elements integrated circuits resulting electrostatic discharge
topic неразрушающий контроль
электростатический разряд
численная модель
url https://doklady.bsuir.by/jour/article/view/319
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AT vfalexeev modelingtemperaturedistributioninthedrivingelementsintegratedcircuitsresultingelectrostaticdischarge
AT vllanin modelingtemperaturedistributioninthedrivingelementsintegratedcircuitsresultingelectrostaticdischarge
AT vglevin modelingtemperaturedistributioninthedrivingelementsintegratedcircuitsresultingelectrostaticdischarge