Noise characteristics of semiconductor lasers with narrow linewidth
Narrow-linewidth semiconductor lasers are highly valued in scientific research and industrial applications owing to their high coherence and low phase noise characteristics, particularly in high-performance optical communications, sensing, and microwave photonic systems. Accuracy, a key objective of...
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| Format: | Article |
| Language: | English |
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Elsevier
2024-10-01
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| Series: | Heliyon |
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| Online Access: | http://www.sciencedirect.com/science/article/pii/S2405844024146178 |
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| author | Hua Wang Yuxin Lei Qiang Cui Siqi Li Xin Song Yongyi Chen Lei Liang Peng Jia Cheng Qiu Yue Song Yubing Wang Yiran Hu Li Qin Lijun Wang |
| author_facet | Hua Wang Yuxin Lei Qiang Cui Siqi Li Xin Song Yongyi Chen Lei Liang Peng Jia Cheng Qiu Yue Song Yubing Wang Yiran Hu Li Qin Lijun Wang |
| author_sort | Hua Wang |
| collection | DOAJ |
| description | Narrow-linewidth semiconductor lasers are highly valued in scientific research and industrial applications owing to their high coherence and low phase noise characteristics, particularly in high-performance optical communications, sensing, and microwave photonic systems. Accuracy, a key objective of many application systems, is determined by the noise of the light source. As system accuracy improves, the requirements for the light source become more stringent, with linewidth reduction and noise reduction being the top priorities. Currently, extensive attention and research are focused on suppressing noise generated by narrow-linewidth lasers. This paper presents noise measurement methods, analyses of the mechanisms for noise suppression, and recent research progress in low-noise semiconductor lasers, focusing on material optimization, structural design, and feedback control. The limitations of current technological solutions are discussed, and future scientific trends are outlined. |
| format | Article |
| id | doaj-art-ecbf417beeac441a9d46cf89d401746a |
| institution | OA Journals |
| issn | 2405-8440 |
| language | English |
| publishDate | 2024-10-01 |
| publisher | Elsevier |
| record_format | Article |
| series | Heliyon |
| spelling | doaj-art-ecbf417beeac441a9d46cf89d401746a2025-08-20T02:13:59ZengElsevierHeliyon2405-84402024-10-011020e3858610.1016/j.heliyon.2024.e38586Noise characteristics of semiconductor lasers with narrow linewidthHua Wang0Yuxin Lei1Qiang Cui2Siqi Li3Xin Song4Yongyi Chen5Lei Liang6Peng Jia7Cheng Qiu8Yue Song9Yubing Wang10Yiran Hu11Li Qin12Lijun Wang13State Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China; Daheng College, University of Chinese Academy of Sciences, Beijing, 100049, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China; Corresponding author.State Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China; Daheng College, University of Chinese Academy of Sciences, Beijing, 100049, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China; Daheng College, University of Chinese Academy of Sciences, Beijing, 100049, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China; Daheng College, University of Chinese Academy of Sciences, Beijing, 100049, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China; Jiguang Semiconductor Technology Co., Ltd., Changchun, 130033, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, China; Daheng College, University of Chinese Academy of Sciences, Beijing, 100049, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, ChinaState Key Laboratory of Luminescence Science and Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, 130033, ChinaNarrow-linewidth semiconductor lasers are highly valued in scientific research and industrial applications owing to their high coherence and low phase noise characteristics, particularly in high-performance optical communications, sensing, and microwave photonic systems. Accuracy, a key objective of many application systems, is determined by the noise of the light source. As system accuracy improves, the requirements for the light source become more stringent, with linewidth reduction and noise reduction being the top priorities. Currently, extensive attention and research are focused on suppressing noise generated by narrow-linewidth lasers. This paper presents noise measurement methods, analyses of the mechanisms for noise suppression, and recent research progress in low-noise semiconductor lasers, focusing on material optimization, structural design, and feedback control. The limitations of current technological solutions are discussed, and future scientific trends are outlined.http://www.sciencedirect.com/science/article/pii/S2405844024146178Semiconductor lasersRelative intensity noisePhase noiseNarrow linewidthLow noise |
| spellingShingle | Hua Wang Yuxin Lei Qiang Cui Siqi Li Xin Song Yongyi Chen Lei Liang Peng Jia Cheng Qiu Yue Song Yubing Wang Yiran Hu Li Qin Lijun Wang Noise characteristics of semiconductor lasers with narrow linewidth Heliyon Semiconductor lasers Relative intensity noise Phase noise Narrow linewidth Low noise |
| title | Noise characteristics of semiconductor lasers with narrow linewidth |
| title_full | Noise characteristics of semiconductor lasers with narrow linewidth |
| title_fullStr | Noise characteristics of semiconductor lasers with narrow linewidth |
| title_full_unstemmed | Noise characteristics of semiconductor lasers with narrow linewidth |
| title_short | Noise characteristics of semiconductor lasers with narrow linewidth |
| title_sort | noise characteristics of semiconductor lasers with narrow linewidth |
| topic | Semiconductor lasers Relative intensity noise Phase noise Narrow linewidth Low noise |
| url | http://www.sciencedirect.com/science/article/pii/S2405844024146178 |
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