Microdetector system for speedy X-ray studies
Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time dependin...
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| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
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Institute for Nuclear Research, National Academy of Sciences of Ukraine
2016-12-01
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| Series: | Ядерна фізика та енергетика |
| Subjects: | |
| Online Access: | http://jnpae.kinr.kiev.ua/17.4/html/17.4.0400.html |
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| author | O. S. Kovalchuk V. V. Burdin V. A. Kyva V. M. Militsiya M. V. Minakov Ie. O. Petrenko V . M. Pugatch D. I. Storozhyk J. Heuser S. O. Firstov A. V. Chaus |
| author_facet | O. S. Kovalchuk V. V. Burdin V. A. Kyva V. M. Militsiya M. V. Minakov Ie. O. Petrenko V . M. Pugatch D. I. Storozhyk J. Heuser S. O. Firstov A. V. Chaus |
| author_sort | O. S. Kovalchuk |
| collection | DOAJ |
| description | Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time depending on the temperature of the test sample (20 - 1500 °C). The position sensitivity of the system based on silicon microstrip sensors read out by commercial XDAS data acquisition system is 40 μm for the scattering angle of X-rays 30° < Θ < 75°. |
| format | Article |
| id | doaj-art-ec6b31ecb9fe4c54bdc70adc68b1f4af |
| institution | DOAJ |
| issn | 1818-331X 2074-0565 |
| language | English |
| publishDate | 2016-12-01 |
| publisher | Institute for Nuclear Research, National Academy of Sciences of Ukraine |
| record_format | Article |
| series | Ядерна фізика та енергетика |
| spelling | doaj-art-ec6b31ecb9fe4c54bdc70adc68b1f4af2025-08-20T03:21:26ZengInstitute for Nuclear Research, National Academy of Sciences of UkraineЯдерна фізика та енергетика1818-331X2074-05652016-12-01174400405Microdetector system for speedy X-ray studiesO. S. Kovalchuk0V. V. Burdin1V. A. Kyva2V. M. Militsiya3M. V. Minakov4Ie. O. Petrenko5V . M. Pugatch6D. I. Storozhyk7J. Heuser8S. O. Firstov9A. V. Chaus10Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv, Ukraine Institute for Problems in Materials Science, National Academy of Sciences of Ukraine, Kyiv, Ukraine Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv, Ukraine Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv, Ukraine Institute for Problems in Materials Science, National Academy of Sciences of Ukraine, Kyiv, Ukraine Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv, Ukraine Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv, Ukraine Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv, Ukraine GSI Helmholtzzentrum fur Schwerionenforschung, Darmstadt, Germany Institute for Problems in Materials Science, National Academy of Sciences of Ukraine, Kyiv, Ukraine Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv, Ukraine Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time depending on the temperature of the test sample (20 - 1500 °C). The position sensitivity of the system based on silicon microstrip sensors read out by commercial XDAS data acquisition system is 40 μm for the scattering angle of X-rays 30° < Θ < 75°.http://jnpae.kinr.kiev.ua/17.4/html/17.4.0400.htmlX-rays diffractionposition sensitive detectorstransient phase transformationstemperature dependence of phase transformations in metalsmicrostrip silicon detectors |
| spellingShingle | O. S. Kovalchuk V. V. Burdin V. A. Kyva V. M. Militsiya M. V. Minakov Ie. O. Petrenko V . M. Pugatch D. I. Storozhyk J. Heuser S. O. Firstov A. V. Chaus Microdetector system for speedy X-ray studies Ядерна фізика та енергетика X-rays diffraction position sensitive detectors transient phase transformations temperature dependence of phase transformations in metals microstrip silicon detectors |
| title | Microdetector system for speedy X-ray studies |
| title_full | Microdetector system for speedy X-ray studies |
| title_fullStr | Microdetector system for speedy X-ray studies |
| title_full_unstemmed | Microdetector system for speedy X-ray studies |
| title_short | Microdetector system for speedy X-ray studies |
| title_sort | microdetector system for speedy x ray studies |
| topic | X-rays diffraction position sensitive detectors transient phase transformations temperature dependence of phase transformations in metals microstrip silicon detectors |
| url | http://jnpae.kinr.kiev.ua/17.4/html/17.4.0400.html |
| work_keys_str_mv | AT oskovalchuk microdetectorsystemforspeedyxraystudies AT vvburdin microdetectorsystemforspeedyxraystudies AT vakyva microdetectorsystemforspeedyxraystudies AT vmmilitsiya microdetectorsystemforspeedyxraystudies AT mvminakov microdetectorsystemforspeedyxraystudies AT ieopetrenko microdetectorsystemforspeedyxraystudies AT vmpugatch microdetectorsystemforspeedyxraystudies AT distorozhyk microdetectorsystemforspeedyxraystudies AT jheuser microdetectorsystemforspeedyxraystudies AT sofirstov microdetectorsystemforspeedyxraystudies AT avchaus microdetectorsystemforspeedyxraystudies |