The Effect of Copper Doping on Some Structural and Electrical Properties of Titanium Dioxide Nanofilms

Thin films of titanium dioxide (TiO2) with several copper ratios were deposited on glass substrates using pulsed laser deposition (PLD) for pure and doped samples (TiO2 Pure, 1 % Cu, 2 % Cu, and 3 % Cu), energy (600 mJ), and frequency (6 Hz).  X-ray diffraction (XRD) showed that the width of the pe...

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Main Authors: Mohammad Adil Razooqi, Zuheer Naji Majeed
Format: Article
Language:English
Published: Tikrit University 2023-12-01
Series:Tikrit Journal of Pure Science
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Online Access:https://tjpsj.org/index.php/tjps/article/view/1377
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_version_ 1850115453964255232
author Mohammad Adil Razooqi
Zuheer Naji Majeed
author_facet Mohammad Adil Razooqi
Zuheer Naji Majeed
author_sort Mohammad Adil Razooqi
collection DOAJ
description Thin films of titanium dioxide (TiO2) with several copper ratios were deposited on glass substrates using pulsed laser deposition (PLD) for pure and doped samples (TiO2 Pure, 1 % Cu, 2 % Cu, and 3 % Cu), energy (600 mJ), and frequency (6 Hz).  X-ray diffraction (XRD) showed that the width of the peaks decreases with increasing the ratio of doping with copper. This leads to an increase in the crystal size and in the intensity of the copper peaks, as well as a gradual decrease in the intensity of the titanium dioxide peaks. The results of the atomic force microscope showed that increasing the inoculation percentage leads to an increase in the surface roughness and the average grain diameter, and thus an increase in the growth of the particle size. The electrical tests (Hall effect) showed that the prepared films are of (n-type) and that the concentration of carriers (n) increased with the doping ratio, while the mobility values ​​(µH) decreased directly with the increase in copper. The electrical conductivity (DC) test showed an increase in the activation energy as a result of the increase in the copper inoculation percentage and thus the electrical conductivity increases. 
format Article
id doaj-art-eb3e1bb6edf8441cb63261dcbaeed0db
institution OA Journals
issn 1813-1662
2415-1726
language English
publishDate 2023-12-01
publisher Tikrit University
record_format Article
series Tikrit Journal of Pure Science
spelling doaj-art-eb3e1bb6edf8441cb63261dcbaeed0db2025-08-20T02:36:34ZengTikrit UniversityTikrit Journal of Pure Science1813-16622415-17262023-12-0128610.25130/tjps.v28i6.1377The Effect of Copper Doping on Some Structural and Electrical Properties of Titanium Dioxide NanofilmsMohammad Adil Razooqi0Zuheer Naji Majeed1Department of Physics, College of Education for Pure Sciences, University of Tikrit, Tikrit, IraqDepartment of Physics, College of Education for Pure Sciences, University of Tikrit, Tikrit, Iraq Thin films of titanium dioxide (TiO2) with several copper ratios were deposited on glass substrates using pulsed laser deposition (PLD) for pure and doped samples (TiO2 Pure, 1 % Cu, 2 % Cu, and 3 % Cu), energy (600 mJ), and frequency (6 Hz).  X-ray diffraction (XRD) showed that the width of the peaks decreases with increasing the ratio of doping with copper. This leads to an increase in the crystal size and in the intensity of the copper peaks, as well as a gradual decrease in the intensity of the titanium dioxide peaks. The results of the atomic force microscope showed that increasing the inoculation percentage leads to an increase in the surface roughness and the average grain diameter, and thus an increase in the growth of the particle size. The electrical tests (Hall effect) showed that the prepared films are of (n-type) and that the concentration of carriers (n) increased with the doping ratio, while the mobility values ​​(µH) decreased directly with the increase in copper. The electrical conductivity (DC) test showed an increase in the activation energy as a result of the increase in the copper inoculation percentage and thus the electrical conductivity increases.  https://tjpsj.org/index.php/tjps/article/view/1377Titanium dioxidePLDXRDAFMHall effectElectrical conductivity.
spellingShingle Mohammad Adil Razooqi
Zuheer Naji Majeed
The Effect of Copper Doping on Some Structural and Electrical Properties of Titanium Dioxide Nanofilms
Tikrit Journal of Pure Science
Titanium dioxide
PLD
XRD
AFM
Hall effect
Electrical conductivity.
title The Effect of Copper Doping on Some Structural and Electrical Properties of Titanium Dioxide Nanofilms
title_full The Effect of Copper Doping on Some Structural and Electrical Properties of Titanium Dioxide Nanofilms
title_fullStr The Effect of Copper Doping on Some Structural and Electrical Properties of Titanium Dioxide Nanofilms
title_full_unstemmed The Effect of Copper Doping on Some Structural and Electrical Properties of Titanium Dioxide Nanofilms
title_short The Effect of Copper Doping on Some Structural and Electrical Properties of Titanium Dioxide Nanofilms
title_sort effect of copper doping on some structural and electrical properties of titanium dioxide nanofilms
topic Titanium dioxide
PLD
XRD
AFM
Hall effect
Electrical conductivity.
url https://tjpsj.org/index.php/tjps/article/view/1377
work_keys_str_mv AT mohammadadilrazooqi theeffectofcopperdopingonsomestructuralandelectricalpropertiesoftitaniumdioxidenanofilms
AT zuheernajimajeed theeffectofcopperdopingonsomestructuralandelectricalpropertiesoftitaniumdioxidenanofilms
AT mohammadadilrazooqi effectofcopperdopingonsomestructuralandelectricalpropertiesoftitaniumdioxidenanofilms
AT zuheernajimajeed effectofcopperdopingonsomestructuralandelectricalpropertiesoftitaniumdioxidenanofilms