Utilizing Symmetric BSIM-SOI SPICE Model for Dynamically Depleted RF SOI T/R Switches and Logic Circuits

In this paper, we present the symmetric BSIM-SOI compact model, specifically designed for Dynamically Depleted Silicon-on-Insulator (DDSOI) MOSFETs, with an emphasis on optimizing their performance in RF Transmit/Receive (T/R) switch applications. This surface potential-based model provides a compre...

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Main Authors: Debashish Nandi, Chetan Kumar Dabhi, Dinesh Rajasekharan, Naveen Karumuri, Sreenidhi Turuvekere, Balaji Swaminathan, Srikanth Srihari, Anupam Dutta, Chenming Hu, Yogesh Singh Chauhan
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal of the Electron Devices Society
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Online Access:https://ieeexplore.ieee.org/document/10726570/
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Summary:In this paper, we present the symmetric BSIM-SOI compact model, specifically designed for Dynamically Depleted Silicon-on-Insulator (DDSOI) MOSFETs, with an emphasis on optimizing their performance in RF Transmit/Receive (T/R) switch applications. This surface potential-based model provides a comprehensive characterization of the device&#x2019;s behavior, covering both Partial Depletion (PD), Full Depletion (FD), and a smooth transition between PD-FD operational regimes, i.e., Dynamic Depletion (DD), while maintaining source-drain symmetry around <inline-formula> <tex-math notation="LaTeX">$V_{\mathrm { ds}} = 0$ </tex-math></inline-formula>, thereby ensuring an accurate description of higher-order harmonics. The model has been rigorously analyzed and validated incorporating AC, DC, and RF characteristics with correlation to measured hardware data. Additionally, a description of the parasitic capacitances and resistances significant in determining the RF T/R switch performance is provided. Experimental validation was carried out using an advanced Single-Pole Single-Throw (SPST) RF T/R switch from GlobalFoundries Inc., with a thorough evaluation of key parameters such as on-resistance, off-capacitance, insertion loss, and isolation, including their frequency and temperature dependencies. Furthermore, a 65-stage ring oscillator performance was validated through the symmetric BSIMSOI model, demonstrating its effectiveness in logic applications as well.
ISSN:2168-6734