Shi, J., Pelt, D. M., & Batenburg, K. J. Multi-stage deep learning artifact reduction for parallel-beam computed tomography. International Union of Crystallography.
Chicago Style (17th ed.) CitationShi, Jiayang, Daniël M. Pelt, and K. Joost Batenburg. Multi-stage Deep Learning Artifact Reduction for Parallel-beam Computed Tomography. International Union of Crystallography.
MLA (9th ed.) CitationShi, Jiayang, et al. Multi-stage Deep Learning Artifact Reduction for Parallel-beam Computed Tomography. International Union of Crystallography.
Warning: These citations may not always be 100% accurate.