A Screening Technique for Establishing the Stability of Metal Film Resistors
Saved in:
| Main Authors: | N. V. M. Sivaji, L. Satyanarayana, A. P. Goswami |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
1978-01-01
|
| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/APEC.5.71 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Factors Affecting Laser-Trim Stability of Thick Film Resistors
by: J. T. Herman, et al.
Published: (1977-01-01) -
Thermoelectric Power in Thick Film Resistors
by: A. Cattaneo, et al.
Published: (1976-01-01) -
Thick Film Fail-Safe Resistors
by: D. L. Wojcicka, et al.
Published: (1983-01-01) -
Electrical Transport in Thick Film Resistors
by: Robert M. Hill
Published: (1980-01-01) -
Resistor Model of Layered Film Structures
by: Tung Pham Van, et al.
Published: (2023-04-01)