Robustness test method for intelligent electronic device
To detect the robustness of communication module of intelligent electronic devices（IED）in smart station,a device robustness test method was presented based on abnormal messages,and a robustness testing system was achieved.Some devices were selected for robustness test experiment to verify the ration...
Saved in:
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | zho |
| Published: |
Beijing Xintong Media Co., Ltd
2015-12-01
|
| Series: | Dianxin kexue |
| Subjects: | |
| Online Access: | http://www.telecomsci.com/thesisDetails#10.11959/j.issn.1000-0801.2015390 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1850213534354374656 |
|---|---|
| author | Haitao JIANG Bin LI Xiang WANG Jinming CHEN Yajuan GUO |
| author_facet | Haitao JIANG Bin LI Xiang WANG Jinming CHEN Yajuan GUO |
| author_sort | Haitao JIANG |
| collection | DOAJ |
| description | To detect the robustness of communication module of intelligent electronic devices（IED）in smart station,a device robustness test method was presented based on abnormal messages,and a robustness testing system was achieved.Some devices were selected for robustness test experiment to verify the rationality and feasibility.Results show that the method can effectively detect the robustness of devices and locate the abnormal messages which cause devices' failure. |
| format | Article |
| id | doaj-art-e659c3093ca042688cda5a990445d3d3 |
| institution | OA Journals |
| issn | 1000-0801 |
| language | zho |
| publishDate | 2015-12-01 |
| publisher | Beijing Xintong Media Co., Ltd |
| record_format | Article |
| series | Dianxin kexue |
| spelling | doaj-art-e659c3093ca042688cda5a990445d3d32025-08-20T02:09:07ZzhoBeijing Xintong Media Co., LtdDianxin kexue1000-08012015-12-013112513159612190Robustness test method for intelligent electronic deviceHaitao JIANGBin LIXiang WANGJinming CHENYajuan GUOTo detect the robustness of communication module of intelligent electronic devices（IED）in smart station,a device robustness test method was presented based on abnormal messages,and a robustness testing system was achieved.Some devices were selected for robustness test experiment to verify the rationality and feasibility.Results show that the method can effectively detect the robustness of devices and locate the abnormal messages which cause devices' failure.http://www.telecomsci.com/thesisDetails#10.11959/j.issn.1000-0801.2015390robustness test;intelligent electronic device;smart substation |
| spellingShingle | Haitao JIANG Bin LI Xiang WANG Jinming CHEN Yajuan GUO Robustness test method for intelligent electronic device Dianxin kexue robustness test;intelligent electronic device;smart substation |
| title | Robustness test method for intelligent electronic device |
| title_full | Robustness test method for intelligent electronic device |
| title_fullStr | Robustness test method for intelligent electronic device |
| title_full_unstemmed | Robustness test method for intelligent electronic device |
| title_short | Robustness test method for intelligent electronic device |
| title_sort | robustness test method for intelligent electronic device |
| topic | robustness test;intelligent electronic device;smart substation |
| url | http://www.telecomsci.com/thesisDetails#10.11959/j.issn.1000-0801.2015390 |
| work_keys_str_mv | AT haitaojiang robustnesstestmethodforintelligentelectronicdevice AT binli robustnesstestmethodforintelligentelectronicdevice AT xiangwang robustnesstestmethodforintelligentelectronicdevice AT jinmingchen robustnesstestmethodforintelligentelectronicdevice AT yajuanguo robustnesstestmethodforintelligentelectronicdevice |