APA (7th ed.) Citation

Solov'ev, A. N., Cherpakov, A. V., Vasil’ev, P. V., Parinov, I. A., & Kirillova, E. V. Neural network technology for identifying defect sizes in half-plane based on time and positional scanning. Don State Technical University.

Chicago Style (17th ed.) Citation

Solov'ev, A. N., A. V. Cherpakov, P. V. Vasil’ev, I. A. Parinov, and E. V. Kirillova. Neural Network Technology for Identifying Defect Sizes in Half-plane Based on Time and Positional Scanning. Don State Technical University.

MLA (9th ed.) Citation

Solov'ev, A. N., et al. Neural Network Technology for Identifying Defect Sizes in Half-plane Based on Time and Positional Scanning. Don State Technical University.