Ito, S., Yamagishi, T., Matsumoto, K., & Kamiya, K. Investigation and Improvement of Inconsistency in Surface-Form Measurement Results Due to Difference of Incident Direction of Measuring Light in Abramson-Type Oblique-Incident Interferometer. MDPI AG.
Chicago Style (17th ed.) CitationIto, So, Takumi Yamagishi, Kimihisa Matsumoto, and Kazuhide Kamiya. Investigation and Improvement of Inconsistency in Surface-Form Measurement Results Due to Difference of Incident Direction of Measuring Light in Abramson-Type Oblique-Incident Interferometer. MDPI AG.
MLA (9th ed.) CitationIto, So, et al. Investigation and Improvement of Inconsistency in Surface-Form Measurement Results Due to Difference of Incident Direction of Measuring Light in Abramson-Type Oblique-Incident Interferometer. MDPI AG.