Mass-spectrometric research of ion sputtering processes at high primary ion energies
The article is devoted to mass-spectrometric investigation of ion sputtering processes in a wide range of primary ion energies. For this purpose a design of the secondary neutral mass-spectrometer is developed, which unlike the traditional devices of the given type is produced on the base of ion imp...
Saved in:
| Main Authors: | V.A. Baturin, S.A. Yeryomin |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Sumy State University
2009-01-01
|
| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2009/1/articles/en/jnep_eng_2009_V1_N1_71-91.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Calculation of the System Focusing Electron Beam in the Ion Source of Mass Spectrometer with Electron Impact Ionization
by: О.S. Kuzema, et al.
Published: (2011-01-01) -
Effect of CO2 addition to Ar on gas cluster ion beam sputtering of a Si wafer: An in-situ XPS study
by: Byeong Jun Cha, et al.
Published: (2025-06-01) -
Investigation of the process of reactive ion-beam sputtering of gallium arsenide using optical emission spectroscopy
by: E. V. Тelesh
Published: (2021-02-01) -
Effect of Ion Magnetron Sputtering Method on Scanning Electron Microscopy (SEM)Images of Materials with Different Surface Properties
by: ZHANG Jie, ZOU Junwen, LIU Xueguang, LI Xiaoying
Published: (2024-12-01) -
The efficiency of a focusing system when ion current transporting to the differential pumping system of a mass spectrometer
by: Pomozov Timofey, et al.
Published: (2024-12-01)