Mass-spectrometric research of ion sputtering processes at high primary ion energies

The article is devoted to mass-spectrometric investigation of ion sputtering processes in a wide range of primary ion energies. For this purpose a design of the secondary neutral mass-spectrometer is developed, which unlike the traditional devices of the given type is produced on the base of ion imp...

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Main Authors: V.A. Baturin, S.A. Yeryomin
Format: Article
Language:English
Published: Sumy State University 2009-01-01
Series:Журнал нано- та електронної фізики
Subjects:
Online Access:http://jnep.sumdu.edu.ua/download/numbers/2009/1/articles/en/jnep_eng_2009_V1_N1_71-91.pdf
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author V.A. Baturin
S.A. Yeryomin
author_facet V.A. Baturin
S.A. Yeryomin
author_sort V.A. Baturin
collection DOAJ
description The article is devoted to mass-spectrometric investigation of ion sputtering processes in a wide range of primary ion energies. For this purpose a design of the secondary neutral mass-spectrometer is developed, which unlike the traditional devices of the given type is produced on the base of ion implanter that generates ion beams with energies up to 170 keV and current density on the target up to 1 mA/cm2. Computer simulation of the electron and positively charged ion trajectories in sputtered particle detection system is performed and the optimal parameters of a system for three modes of operation are determined. The emission of sputtered neutral copper clusters and the preferential sputtering processes of molybdenum isotopes at different parameters of the primary ion beam are studied.
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publisher Sumy State University
record_format Article
series Журнал нано- та електронної фізики
spelling doaj-art-e59183c15776445b9fc7b0b5ea13fb3c2025-08-20T03:26:21ZengSumy State UniversityЖурнал нано- та електронної фізики2077-67722009-01-01117191Mass-spectrometric research of ion sputtering processes at high primary ion energiesV.A. BaturinS.A. YeryominThe article is devoted to mass-spectrometric investigation of ion sputtering processes in a wide range of primary ion energies. For this purpose a design of the secondary neutral mass-spectrometer is developed, which unlike the traditional devices of the given type is produced on the base of ion implanter that generates ion beams with energies up to 170 keV and current density on the target up to 1 mA/cm2. Computer simulation of the electron and positively charged ion trajectories in sputtered particle detection system is performed and the optimal parameters of a system for three modes of operation are determined. The emission of sputtered neutral copper clusters and the preferential sputtering processes of molybdenum isotopes at different parameters of the primary ion beam are studied.http://jnep.sumdu.edu.ua/download/numbers/2009/1/articles/en/jnep_eng_2009_V1_N1_71-91.pdfIon beamsputteringsecondary neutralsclusterisotopemass-spectrometer
spellingShingle V.A. Baturin
S.A. Yeryomin
Mass-spectrometric research of ion sputtering processes at high primary ion energies
Журнал нано- та електронної фізики
Ion beam
sputtering
secondary neutrals
cluster
isotope
mass-spectrometer
title Mass-spectrometric research of ion sputtering processes at high primary ion energies
title_full Mass-spectrometric research of ion sputtering processes at high primary ion energies
title_fullStr Mass-spectrometric research of ion sputtering processes at high primary ion energies
title_full_unstemmed Mass-spectrometric research of ion sputtering processes at high primary ion energies
title_short Mass-spectrometric research of ion sputtering processes at high primary ion energies
title_sort mass spectrometric research of ion sputtering processes at high primary ion energies
topic Ion beam
sputtering
secondary neutrals
cluster
isotope
mass-spectrometer
url http://jnep.sumdu.edu.ua/download/numbers/2009/1/articles/en/jnep_eng_2009_V1_N1_71-91.pdf
work_keys_str_mv AT vabaturin massspectrometricresearchofionsputteringprocessesathighprimaryionenergies
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