Measuring. Monitoring. Management. Control
Background. The task of producing high-speed semiconductor elements is inextricably linked with the use of MD structures used as the basis for these elements with weakly pronounced relaxation properties. Materials and methods. To measure the time constant of the exponential component of the pulse vo...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Penza State University Publishing House
2025-04-01
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| Series: | Измерение, мониторинг, управление, контроль |
| Subjects: | |
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