Image-based anomaly detection in low-light industrial environments with feature enhancement
Industrial anomaly detection and localization are essential for maintaining product quality and safety in manufacturing. However, these tasks become significantly more challenging in low-light environments, where poor illumination introduces noise and reduces visibility, leading to degraded performa...
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Main Authors: | Dinh-Cuong Hoang, Phan Xuan Tan, Anh-Nhat Nguyen, Son-Anh Bui, Ta Huu Anh Duong, Tuan-Minh Huynh, Duc-Manh Nguyen, Viet-Anh Trinh, Quang-Huy Ha, Nguyen Dinh Bao Long, Duc-Thanh Tran, Xuan-Tung Dinh, Van-Hiep Duong, Tran Thi Thuy Trang |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2025-03-01
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Series: | Results in Engineering |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S2590123025003901 |
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