Image-based anomaly detection in low-light industrial environments with feature enhancement

Image-based anomaly detection in low-light industrial environments with feature enhancement

Industrial anomaly detection and localization are essential for maintaining product quality and safety in manufacturing. However, these tasks become significantly more challenging in low-light environments, where poor illumination introduces noise and reduces visibility, leading to degraded performa...

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Bibliographic Details
Main Authors: Dinh-Cuong Hoang, Phan Xuan Tan, Anh-Nhat Nguyen, Son-Anh Bui, Ta Huu Anh Duong, Tuan-Minh Huynh, Duc-Manh Nguyen, Viet-Anh Trinh, Quang-Huy Ha, Nguyen Dinh Bao Long, Duc-Thanh Tran, Xuan-Tung Dinh, Van-Hiep Duong, Tran Thi Thuy Trang
Format: Article
Language:English
Published: Elsevier 2025-03-01
Series:Results in Engineering
Subjects:
Industrial anomaly detection
Defect recognition
Surface inspection
Surface defect localization
Visual inspection
Low-light environments
Online Access:http://www.sciencedirect.com/science/article/pii/S2590123025003901
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