New scan compression approach to reduce the test data volume
Abstract The test data volume (TDV) increases with increased target compression in scan compression and adds to the test cost. Increased TDV is the result of a dependency across scan flip‐flops (SFFs) that resulted from compression architecture, which is absent in scan mode. The SFFs have uncompress...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2021-07-01
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| Series: | IET Computers & Digital Techniques |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/cdt2.12020 |
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