Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects
Silicon nanowires are leading the CMOS era towards the downsizing limit and its nature will be effectively suppress the short channel effects. Accurate modeling of thermal noise in nanowires is crucial for RF applications of nano-CMOS emerging technologies. In this work, a perfect temperature-depend...
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| Format: | Article |
| Language: | English |
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Wiley
2014-01-01
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| Series: | Modelling and Simulation in Engineering |
| Online Access: | http://dx.doi.org/10.1155/2014/635803 |
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| _version_ | 1850167242169253888 |
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| author | P. Anandan N. Malathi N. Mohankumar |
| author_facet | P. Anandan N. Malathi N. Mohankumar |
| author_sort | P. Anandan |
| collection | DOAJ |
| description | Silicon nanowires are leading the CMOS era towards the downsizing limit and its nature will be effectively suppress the short channel effects. Accurate modeling of thermal noise in nanowires is crucial for RF applications of nano-CMOS emerging technologies. In this work, a perfect temperature-dependent model for silicon nanowires including the self-heating effects has been derived and its effects on device parameters have been observed. The power spectral density as a function of thermal resistance shows significant improvement as the channel length decreases. The effects of thermal noise including self-heating of the device are explored. Moreover, significant reduction in noise with respect to channel thermal resistance, gate length, and biasing is analyzed. |
| format | Article |
| id | doaj-art-e2cf492003f04d22b6a83c0ad9ba7972 |
| institution | OA Journals |
| issn | 1687-5591 1687-5605 |
| language | English |
| publishDate | 2014-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Modelling and Simulation in Engineering |
| spelling | doaj-art-e2cf492003f04d22b6a83c0ad9ba79722025-08-20T02:21:14ZengWileyModelling and Simulation in Engineering1687-55911687-56052014-01-01201410.1155/2014/635803635803Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating EffectsP. Anandan0N. Malathi1N. Mohankumar2SKP Engineering College, Tiruvannamalai, Tamil Nadu 606 611, IndiaSKP Engineering College, Tiruvannamalai, Tamil Nadu 606 611, IndiaSKP Engineering College, Tiruvannamalai, Tamil Nadu 606 611, IndiaSilicon nanowires are leading the CMOS era towards the downsizing limit and its nature will be effectively suppress the short channel effects. Accurate modeling of thermal noise in nanowires is crucial for RF applications of nano-CMOS emerging technologies. In this work, a perfect temperature-dependent model for silicon nanowires including the self-heating effects has been derived and its effects on device parameters have been observed. The power spectral density as a function of thermal resistance shows significant improvement as the channel length decreases. The effects of thermal noise including self-heating of the device are explored. Moreover, significant reduction in noise with respect to channel thermal resistance, gate length, and biasing is analyzed.http://dx.doi.org/10.1155/2014/635803 |
| spellingShingle | P. Anandan N. Malathi N. Mohankumar Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects Modelling and Simulation in Engineering |
| title | Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects |
| title_full | Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects |
| title_fullStr | Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects |
| title_full_unstemmed | Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects |
| title_short | Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects |
| title_sort | modeling of temperature dependent noise in silicon nanowire fets including self heating effects |
| url | http://dx.doi.org/10.1155/2014/635803 |
| work_keys_str_mv | AT panandan modelingoftemperaturedependentnoiseinsiliconnanowirefetsincludingselfheatingeffects AT nmalathi modelingoftemperaturedependentnoiseinsiliconnanowirefetsincludingselfheatingeffects AT nmohankumar modelingoftemperaturedependentnoiseinsiliconnanowirefetsincludingselfheatingeffects |