Measuring error rates of mid-circuit measurements
Abstract High-fidelity mid-circuit measurements, which read out the state of specific qubits in a multiqubit processor without destroying them or disrupting their neighbors, are a critical component for useful quantum computing. They enable fault-tolerant quantum error correction, dynamic circuits,...
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| Main Authors: | Daniel Hothem, Jordan Hines, Charles Baldwin, Dan Gresh, Robin Blume-Kohout, Timothy Proctor |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-07-01
|
| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-025-60923-x |
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