Measuring error rates of mid-circuit measurements
Abstract High-fidelity mid-circuit measurements, which read out the state of specific qubits in a multiqubit processor without destroying them or disrupting their neighbors, are a critical component for useful quantum computing. They enable fault-tolerant quantum error correction, dynamic circuits,...
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| Format: | Article |
| Language: | English |
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Nature Portfolio
2025-07-01
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| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/s41467-025-60923-x |
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| _version_ | 1849334431447252992 |
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| author | Daniel Hothem Jordan Hines Charles Baldwin Dan Gresh Robin Blume-Kohout Timothy Proctor |
| author_facet | Daniel Hothem Jordan Hines Charles Baldwin Dan Gresh Robin Blume-Kohout Timothy Proctor |
| author_sort | Daniel Hothem |
| collection | DOAJ |
| description | Abstract High-fidelity mid-circuit measurements, which read out the state of specific qubits in a multiqubit processor without destroying them or disrupting their neighbors, are a critical component for useful quantum computing. They enable fault-tolerant quantum error correction, dynamic circuits, and other paths to solving classically intractable problems. But there are few methods to assess their performance comprehensively. In this work, we address this gap by introducing the first randomized benchmarking protocol that measures the rate at which mid-circuit measurements induce errors in many-qubit circuits. Using this protocol, we detect and eliminate previously undetected measurement-induced crosstalk in a 20-qubit trapped-ion quantum computer. Then, we use the same protocol to measure the rate of measurement-induced crosstalk error on a 27-qubit IBM Q processor, and quantify how much of that error is eliminated by dynamical decoupling. |
| format | Article |
| id | doaj-art-e205469edf0041d8a88e14983c18ce7f |
| institution | Kabale University |
| issn | 2041-1723 |
| language | English |
| publishDate | 2025-07-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Nature Communications |
| spelling | doaj-art-e205469edf0041d8a88e14983c18ce7f2025-08-20T03:45:34ZengNature PortfolioNature Communications2041-17232025-07-011611910.1038/s41467-025-60923-xMeasuring error rates of mid-circuit measurementsDaniel Hothem0Jordan Hines1Charles Baldwin2Dan Gresh3Robin Blume-Kohout4Timothy Proctor5Quantum Performance Laboratory, Sandia National LaboratoriesDepartment of Physics, University of CaliforniaQuantinuum, 303 S. Technology Ct.Quantinuum, 303 S. Technology Ct.Quantum Performance Laboratory, Sandia National LaboratoriesQuantum Performance Laboratory, Sandia National LaboratoriesAbstract High-fidelity mid-circuit measurements, which read out the state of specific qubits in a multiqubit processor without destroying them or disrupting their neighbors, are a critical component for useful quantum computing. They enable fault-tolerant quantum error correction, dynamic circuits, and other paths to solving classically intractable problems. But there are few methods to assess their performance comprehensively. In this work, we address this gap by introducing the first randomized benchmarking protocol that measures the rate at which mid-circuit measurements induce errors in many-qubit circuits. Using this protocol, we detect and eliminate previously undetected measurement-induced crosstalk in a 20-qubit trapped-ion quantum computer. Then, we use the same protocol to measure the rate of measurement-induced crosstalk error on a 27-qubit IBM Q processor, and quantify how much of that error is eliminated by dynamical decoupling.https://doi.org/10.1038/s41467-025-60923-x |
| spellingShingle | Daniel Hothem Jordan Hines Charles Baldwin Dan Gresh Robin Blume-Kohout Timothy Proctor Measuring error rates of mid-circuit measurements Nature Communications |
| title | Measuring error rates of mid-circuit measurements |
| title_full | Measuring error rates of mid-circuit measurements |
| title_fullStr | Measuring error rates of mid-circuit measurements |
| title_full_unstemmed | Measuring error rates of mid-circuit measurements |
| title_short | Measuring error rates of mid-circuit measurements |
| title_sort | measuring error rates of mid circuit measurements |
| url | https://doi.org/10.1038/s41467-025-60923-x |
| work_keys_str_mv | AT danielhothem measuringerrorratesofmidcircuitmeasurements AT jordanhines measuringerrorratesofmidcircuitmeasurements AT charlesbaldwin measuringerrorratesofmidcircuitmeasurements AT dangresh measuringerrorratesofmidcircuitmeasurements AT robinblumekohout measuringerrorratesofmidcircuitmeasurements AT timothyproctor measuringerrorratesofmidcircuitmeasurements |