Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree
Negative Ion Source Neutral beam Injection (NNBI), as a critical auxiliary heating system for magnetic confinement fusion devices, directly affects the plasma heating efficiency of tokamak devices through the reliability of its beam source system. The single-shot experiment constitutes a significant...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-08-01
|
| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/15/15/8556 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1849239845551996928 |
|---|---|
| author | Qian Cao Lizhen Liang |
| author_facet | Qian Cao Lizhen Liang |
| author_sort | Qian Cao |
| collection | DOAJ |
| description | Negative Ion Source Neutral beam Injection (NNBI), as a critical auxiliary heating system for magnetic confinement fusion devices, directly affects the plasma heating efficiency of tokamak devices through the reliability of its beam source system. The single-shot experiment constitutes a significant experimental program for NNBI. This study addresses the frequent equipment failures encountered by the NNBI beam source system during a cycle of experiments, employing fault tree analysis (FTA) to conduct a systematic reliability assessment. Utilizing the AutoFTA 3.9 software platform, a fault tree model of the beam source system was established. Minimal cut set analysis was performed to identify the system’s weak points. The research employed AutoFTA 3.9 for both qualitative analysis and quantitative calculations, obtaining the failure probabilities of critical components. Furthermore, the F-V importance measure and mean time between failures (MTBF) were applied to analyze the system. This provides a theoretical basis and practical engineering guidance for enhancing the operational reliability of the NNBI system. The evaluation methodology developed in this study can be extended and applied to the reliability analysis of other high-power particle acceleration systems. |
| format | Article |
| id | doaj-art-e19f3b5b604f45cdb96f0a5d912fb9d3 |
| institution | Kabale University |
| issn | 2076-3417 |
| language | English |
| publishDate | 2025-08-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Applied Sciences |
| spelling | doaj-art-e19f3b5b604f45cdb96f0a5d912fb9d32025-08-20T04:00:49ZengMDPI AGApplied Sciences2076-34172025-08-011515855610.3390/app15158556Device Reliability Analysis of NNBI Beam Source System Based on Fault TreeQian Cao0Lizhen Liang1School of Safety Science and Engineering, Anhui University of Science and Technology, Huainan 232001, ChinaInstitute of Energy, Hefei Comprehensive National Science Center (Anhui Energy Laboratory), Hefei 230031, ChinaNegative Ion Source Neutral beam Injection (NNBI), as a critical auxiliary heating system for magnetic confinement fusion devices, directly affects the plasma heating efficiency of tokamak devices through the reliability of its beam source system. The single-shot experiment constitutes a significant experimental program for NNBI. This study addresses the frequent equipment failures encountered by the NNBI beam source system during a cycle of experiments, employing fault tree analysis (FTA) to conduct a systematic reliability assessment. Utilizing the AutoFTA 3.9 software platform, a fault tree model of the beam source system was established. Minimal cut set analysis was performed to identify the system’s weak points. The research employed AutoFTA 3.9 for both qualitative analysis and quantitative calculations, obtaining the failure probabilities of critical components. Furthermore, the F-V importance measure and mean time between failures (MTBF) were applied to analyze the system. This provides a theoretical basis and practical engineering guidance for enhancing the operational reliability of the NNBI system. The evaluation methodology developed in this study can be extended and applied to the reliability analysis of other high-power particle acceleration systems.https://www.mdpi.com/2076-3417/15/15/8556beam source systemFTAF-V importance measurefailure ratereliability analysisnegative ion source |
| spellingShingle | Qian Cao Lizhen Liang Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree Applied Sciences beam source system FTA F-V importance measure failure rate reliability analysis negative ion source |
| title | Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree |
| title_full | Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree |
| title_fullStr | Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree |
| title_full_unstemmed | Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree |
| title_short | Device Reliability Analysis of NNBI Beam Source System Based on Fault Tree |
| title_sort | device reliability analysis of nnbi beam source system based on fault tree |
| topic | beam source system FTA F-V importance measure failure rate reliability analysis negative ion source |
| url | https://www.mdpi.com/2076-3417/15/15/8556 |
| work_keys_str_mv | AT qiancao devicereliabilityanalysisofnnbibeamsourcesystembasedonfaulttree AT lizhenliang devicereliabilityanalysisofnnbibeamsourcesystembasedonfaulttree |