Resolution Improvement for Coherent Illumination Microscopy via Incident Light Phase Modulation

In order to break the diffraction limit and improve the imaging resolution of optical microscope, in this article, we theoretically deduced the influence of phase difference on imaging resolution under coherent illumination. As the phase difference increased, the resolution improved gradually. Inspi...

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Main Authors: Jinzhong Ling, Yangyang Li, Jinkun Guo, Xin Liu, Xiaorui Wang
Format: Article
Language:English
Published: MDPI AG 2024-10-01
Series:Optics
Subjects:
Online Access:https://www.mdpi.com/2673-3269/5/4/30
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author Jinzhong Ling
Yangyang Li
Jinkun Guo
Xin Liu
Xiaorui Wang
author_facet Jinzhong Ling
Yangyang Li
Jinkun Guo
Xin Liu
Xiaorui Wang
author_sort Jinzhong Ling
collection DOAJ
description In order to break the diffraction limit and improve the imaging resolution of optical microscope, in this article, we theoretically deduced the influence of phase difference on imaging resolution under coherent illumination. As the phase difference increased, the resolution improved gradually. Inspired by this conclusion, a super-resolution optical imaging system based on phase modulation was proposed and simulated. An optical mask was designed to generate additional phase difference for the adjacent area at the sample’s surface, and the influence of its structural parameters was analyzed numerically. The simulation results preliminarily confirm the feasibility of this scheme, laying the foundation for a more optimal and comprehensive super-resolution imaging scheme. Due to its advantages of high resolution, a wide field of view, and being compatible, this non-fluorescence super-resolution imaging scheme is worthy of further research and application.
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publishDate 2024-10-01
publisher MDPI AG
record_format Article
series Optics
spelling doaj-art-e15b9a101c3c4cf391036b753e85850e2025-08-20T02:50:41ZengMDPI AGOptics2673-32692024-10-015440641510.3390/opt5040030Resolution Improvement for Coherent Illumination Microscopy via Incident Light Phase ModulationJinzhong Ling0Yangyang Li1Jinkun Guo2Xin Liu3Xiaorui Wang4School of Optoelectronic Engineering, Xidian University, Xi’an 710071, ChinaSchool of Optoelectronic Engineering, Xidian University, Xi’an 710071, ChinaSchool of Optoelectronic Engineering, Xidian University, Xi’an 710071, ChinaSchool of Optoelectronic Engineering, Xidian University, Xi’an 710071, ChinaSchool of Optoelectronic Engineering, Xidian University, Xi’an 710071, ChinaIn order to break the diffraction limit and improve the imaging resolution of optical microscope, in this article, we theoretically deduced the influence of phase difference on imaging resolution under coherent illumination. As the phase difference increased, the resolution improved gradually. Inspired by this conclusion, a super-resolution optical imaging system based on phase modulation was proposed and simulated. An optical mask was designed to generate additional phase difference for the adjacent area at the sample’s surface, and the influence of its structural parameters was analyzed numerically. The simulation results preliminarily confirm the feasibility of this scheme, laying the foundation for a more optimal and comprehensive super-resolution imaging scheme. Due to its advantages of high resolution, a wide field of view, and being compatible, this non-fluorescence super-resolution imaging scheme is worthy of further research and application.https://www.mdpi.com/2673-3269/5/4/30microscopydiffraction limitsuper-resolution imagingphase modulation
spellingShingle Jinzhong Ling
Yangyang Li
Jinkun Guo
Xin Liu
Xiaorui Wang
Resolution Improvement for Coherent Illumination Microscopy via Incident Light Phase Modulation
Optics
microscopy
diffraction limit
super-resolution imaging
phase modulation
title Resolution Improvement for Coherent Illumination Microscopy via Incident Light Phase Modulation
title_full Resolution Improvement for Coherent Illumination Microscopy via Incident Light Phase Modulation
title_fullStr Resolution Improvement for Coherent Illumination Microscopy via Incident Light Phase Modulation
title_full_unstemmed Resolution Improvement for Coherent Illumination Microscopy via Incident Light Phase Modulation
title_short Resolution Improvement for Coherent Illumination Microscopy via Incident Light Phase Modulation
title_sort resolution improvement for coherent illumination microscopy via incident light phase modulation
topic microscopy
diffraction limit
super-resolution imaging
phase modulation
url https://www.mdpi.com/2673-3269/5/4/30
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