Huang, C., & Chiu, F. A Substrate-and-Gate Triggering NMOS Device for High ESD Reliability in Deep Submicrometer Technology. Wiley.
Chicago Style (17th ed.) CitationHuang, Chih-Yao, and Fu-Chien Chiu. A Substrate-and-Gate Triggering NMOS Device for High ESD Reliability in Deep Submicrometer Technology. Wiley.
MLA (9th ed.) CitationHuang, Chih-Yao, and Fu-Chien Chiu. A Substrate-and-Gate Triggering NMOS Device for High ESD Reliability in Deep Submicrometer Technology. Wiley.
Warning: These citations may not always be 100% accurate.