APA (7th ed.) Citation

Huang, S., He, B., Wang, J., Li, X., Kang, R., & Li, F. Intelligence model-driven multi-stress adaptive reliability enhancement testing technology. AIP Publishing LLC.

Chicago Style (17th ed.) Citation

Huang, Shouqing, Beichen He, Jing Wang, Xiaoyang Li, Rui Kang, and Fangyong Li. Intelligence Model-driven Multi-stress Adaptive Reliability Enhancement Testing Technology. AIP Publishing LLC.

MLA (9th ed.) Citation

Huang, Shouqing, et al. Intelligence Model-driven Multi-stress Adaptive Reliability Enhancement Testing Technology. AIP Publishing LLC.