Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training
This paper presents the integration of several deep learning techniques for defect inspection of plated through-hole (PTH) on printed circuit boards (PCBs). In our proposed system, the object detection technology of You Only Look Once (YOLO) allocates the position of PTHs; a semi-automatic clusterin...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10792891/ |
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