APA (7th ed.) Citation

Hsieh, C., Tseng, L., Chen, Y., Tsai, C., & Wu, C. Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training. IEEE.

Chicago Style (17th ed.) Citation

Hsieh, Chang-Yeh, Ling-Shen Tseng, Yi-Han Chen, Chiung-Hui Tsai, and Chih-Hung Wu. Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training. IEEE.

MLA (9th ed.) Citation

Hsieh, Chang-Yeh, et al. Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based Auto-Labeling and GAN-Based Model Training. IEEE.