AFM Image Segmentation Based on Wave Growth of Local Maximum Regions with their Selection in Order of Decreasing Values

AFM Image Segmentation Based on Wave Growth of Local Maximum Regions with their Selection in Order of Decreasing Values

The problem of determining the number of objects in atomic force microscopy (AFM) images is considered. For the automatic (without operator participation) solution of this problem, segmentation is used, dividing images into areas containing objects of interest. Known segmentation algorithms based on...

Full description

Saved in:
Bibliographic Details
Main Authors: V. V. Rabtsevich, V. Y. Tsviatkou
Format: Article
Language:Russian
Published: Educational institution «Belarusian State University of Informatics and Radioelectronics» 2022-06-01
Series:Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki
Subjects:
image segmentation
atomic force microscopy
wave growing regions
vincent-sulli watershed
local maximum
afm images
marker watershed
Online Access:https://doklady.bsuir.by/jour/article/view/3366
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items