A New Stability Test for Passivated NiCr Thin Film Resistors
A suitable short-time test for analysis of long term stability is presented for the case of passivated NiCr thin film resistors revealing an aging characteristic which is not of Arrhenius type. Based on the in-situ measurement of resistance change during a continuous temperature rise, so-called temp...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
1989-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1989/90823 |
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