A New Stability Test for Passivated NiCr Thin Film Resistors
A suitable short-time test for analysis of long term stability is presented for the case of passivated NiCr thin film resistors revealing an aging characteristic which is not of Arrhenius type. Based on the in-situ measurement of resistance change during a continuous temperature rise, so-called temp...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
1989-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1989/90823 |
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| Summary: | A suitable short-time test for analysis of long term stability is presented for the case of
passivated NiCr thin film resistors revealing an aging characteristic which is not of Arrhenius
type. Based on the in-situ measurement of resistance change during a continuous temperature
rise, so-called temperature ramp curve, a well-defined correlation is found between the film
stability and a characteristic temperature Tp where the temperature ramp curve exhibits a
maximum. In this way, a reliable prediction of the long term stability can be made within
only a few hours. The influence of the heating rate on the characteristic temperature Tp is
shown. Furthermore, it is experimentally proved that the values of Tp are not essentially
determined by the reversible resistance changes due to differential temperature coefficient of
resistance, but indeed by irreversible aging processes. |
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| ISSN: | 0882-7516 1563-5031 |