Proposal of High-Temperature-Operation Tolerant SOI MOSFET and Preliminary Study on Device Performance Evaluation

We propose a high-temperature-operation (HTOT) SOI MOSFET and show preliminary simulation results of its characteristics. It is demonstrated that HTOT SOI MOSFET operates safely at 700 K with no thermal instability because of its expanded effective bandgap. It is shown that its threshold voltage is...

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Bibliographic Details
Main Author: Yasuhisa Omura
Format: Article
Language:English
Published: Wiley 2011-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/2011/850481
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