Measuring system for testing electrical parameters of EMCCDs of various formats
This article describes the developed equipment that allows measuring the photoelectrical parameters of multielement photodetectors, specifically various formats of EMCCD (electron multiplying charge-coupled device) chips. The authors present the measuring techniques and test results on dark currents...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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Politehperiodika
2019-12-01
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| Series: | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
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| Online Access: | https://tkea.com.ua/index.php/journal/article/view/114 |
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| _version_ | 1850199600680402944 |
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| author | Viacheslav Zabudsky Oleksandr Golenkov Oleg Rikhalsky Vladimir Reva Sergij Korinets Sergey Dukhnin |
| author_facet | Viacheslav Zabudsky Oleksandr Golenkov Oleg Rikhalsky Vladimir Reva Sergij Korinets Sergey Dukhnin |
| author_sort | Viacheslav Zabudsky |
| collection | DOAJ |
| description | This article describes the developed equipment that allows measuring the photoelectrical parameters of multielement photodetectors, specifically various formats of EMCCD (electron multiplying charge-coupled device) chips. The authors present the measuring techniques and test results on dark currents, output amplifier sensitivity, charge transfer efficiency, charge capacity and other parameters. The studies were conducted, both on the wafer and in the body, on samples of the following formats: 576×288, 640×512, 768×576, 1024×1024, and 1280×1024. |
| format | Article |
| id | doaj-art-dd7208e4e58c4210bb20449b8b7c26d7 |
| institution | OA Journals |
| issn | 2225-5818 2309-9992 |
| language | English |
| publishDate | 2019-12-01 |
| publisher | Politehperiodika |
| record_format | Article |
| series | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
| spelling | doaj-art-dd7208e4e58c4210bb20449b8b7c26d72025-08-20T02:12:34ZengPolitehperiodikaTekhnologiya i Konstruirovanie v Elektronnoi Apparature2225-58182309-99922019-12-015–63710.15222/TKEA2019.5-6.03114Measuring system for testing electrical parameters of EMCCDs of various formatsViacheslav Zabudsky0Oleksandr Golenkov1Oleg Rikhalsky2Vladimir Reva3Sergij Korinets4Sergey Dukhnin5V. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of UkraineV. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of UkraineBogomolets Institute of Physiology of NASUV. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of UkraineV. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of UkraineV. Ye. Lashkaryov Institute of Semiconductor Physics, NAS of UkraineThis article describes the developed equipment that allows measuring the photoelectrical parameters of multielement photodetectors, specifically various formats of EMCCD (electron multiplying charge-coupled device) chips. The authors present the measuring techniques and test results on dark currents, output amplifier sensitivity, charge transfer efficiency, charge capacity and other parameters. The studies were conducted, both on the wafer and in the body, on samples of the following formats: 576×288, 640×512, 768×576, 1024×1024, and 1280×1024.https://tkea.com.ua/index.php/journal/article/view/114photodetectorsemccdelectron multiplying charge-coupled devicemeasuring systemphotoelectric parameters |
| spellingShingle | Viacheslav Zabudsky Oleksandr Golenkov Oleg Rikhalsky Vladimir Reva Sergij Korinets Sergey Dukhnin Measuring system for testing electrical parameters of EMCCDs of various formats Tekhnologiya i Konstruirovanie v Elektronnoi Apparature photodetectors emccd electron multiplying charge-coupled device measuring system photoelectric parameters |
| title | Measuring system for testing electrical parameters of EMCCDs of various formats |
| title_full | Measuring system for testing electrical parameters of EMCCDs of various formats |
| title_fullStr | Measuring system for testing electrical parameters of EMCCDs of various formats |
| title_full_unstemmed | Measuring system for testing electrical parameters of EMCCDs of various formats |
| title_short | Measuring system for testing electrical parameters of EMCCDs of various formats |
| title_sort | measuring system for testing electrical parameters of emccds of various formats |
| topic | photodetectors emccd electron multiplying charge-coupled device measuring system photoelectric parameters |
| url | https://tkea.com.ua/index.php/journal/article/view/114 |
| work_keys_str_mv | AT viacheslavzabudsky measuringsystemfortestingelectricalparametersofemccdsofvariousformats AT oleksandrgolenkov measuringsystemfortestingelectricalparametersofemccdsofvariousformats AT olegrikhalsky measuringsystemfortestingelectricalparametersofemccdsofvariousformats AT vladimirreva measuringsystemfortestingelectricalparametersofemccdsofvariousformats AT sergijkorinets measuringsystemfortestingelectricalparametersofemccdsofvariousformats AT sergeydukhnin measuringsystemfortestingelectricalparametersofemccdsofvariousformats |