Failure probability and location identification of damaged insulators using normal function and monitored leakage current

Failure probability and location identification of damaged insulators using normal function and monitored leakage current

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Bibliographic Details
Main Authors: Moein Monemi, Seyed Mohammad Shahrtash, Mohsen Kalantar
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2025-01-01
Series:PLoS ONE
Online Access:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12157345/?tool=EBI
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