Ring Counter Based ATPG for Low Transition Test Pattern Generation
In test mode test patterns are applied in random fashion to the circuit under circuit. This increases switching transition between the consecutive test patterns and thereby increases dynamic power dissipation. The proposed ring counter based ATPG reduces vertical switching transitions by inserting t...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2015-01-01
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| Series: | The Scientific World Journal |
| Online Access: | http://dx.doi.org/10.1155/2015/729165 |
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